Registro completo de metadatos
| Campo DC | Valor | Lengua/Idioma |
|---|---|---|
| dc.creator | Dussan, A. | - |
| dc.creator | Koropecki, Roberto Roman | - |
| dc.creator | Arce, Roberto Delio | - |
| dc.creator | Schmidt, Javier Alejandro | - |
| dc.date | 2017-10-04T20:20:00Z | - |
| dc.date | 2017-10-04T20:20:00Z | - |
| dc.date | 2007-12 | - |
| dc.date | 2017-10-04T14:44:24Z | - |
| dc.date.accessioned | 2019-04-29T15:35:08Z | - |
| dc.date.available | 2019-04-29T15:35:08Z | - |
| dc.date.issued | 2017-10-04T20:20:00Z | - |
| dc.date.issued | 2017-10-04T20:20:00Z | - |
| dc.date.issued | 2007-12 | - |
| dc.date.issued | 2017-10-04T14:44:24Z | - |
| dc.identifier | Dussan, A.; Koropecki, Roberto Roman; Arce, Roberto Delio; Schmidt, Javier Alejandro; Structural and optical properties of compensated microcrystalline silicon films; Sociedad Mexicana de Fisica; Revista Mexicana de Física; 53; 7; 12-2007; 253-255 | - |
| dc.identifier | 0035-001X | - |
| dc.identifier | http://hdl.handle.net/11336/25942 | - |
| dc.identifier | CONICET Digital | - |
| dc.identifier | CONICET | - |
| dc.identifier.uri | http://rodna.bn.gov.ar:8080/jspui/handle/bnmm/297197 | - |
| dc.description | Boron-doped microcrystalline silicon films were deposited in a plasma enhanced chemical vapor deposition (PECVD) system using silane (SiH4) diluted in hydrogen, and diborane (B2H6) as a dopant gas. The effects of the Boron concentration on the optical and structural properties were investigated by the constant-photocurrent method (CPM) and atomic force microscopy (AFM) measurements. The variations in the optical constants (refractive index, absorption coefficient and optical gap) as a function of wavelength were carried out from the optical transmission and CPM spectra. By increasing the doping level, a systematic increase in the absorption coefficient spectra in the low-energy region between 0.7 - 1.2 eV was observed. It was found that the increase of Boron concentration in the samples results in changes of the grain size. Correlations between optical properties and the density of states (DOS) were also studied. | - |
| dc.description | Fil: Dussan, A.. Universidad Nacional de Colombia; Colombia | - |
| dc.description | Fil: Koropecki, Roberto Roman. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Santa Fe. Instituto de Desarrollo Tecnológico para la Industria Química. Universidad Nacional del Litoral. Instituto de Desarrollo Tecnológico para la Industria Química; Argentina | - |
| dc.description | Fil: Arce, Roberto Delio. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Santa Fe. Instituto de Desarrollo Tecnológico para la Industria Química. Universidad Nacional del Litoral. Instituto de Desarrollo Tecnológico para la Industria Química; Argentina | - |
| dc.description | Fil: Schmidt, Javier Alejandro. Consejo Nacional de Investigaciones Científicas y Técnicas. Centro Científico Tecnológico Conicet - Santa Fe. Instituto de Desarrollo Tecnológico para la Industria Química. Universidad Nacional del Litoral. Instituto de Desarrollo Tecnológico para la Industria Química; Argentina | - |
| dc.format | application/pdf | - |
| dc.format | application/pdf | - |
| dc.format | application/pdf | - |
| dc.format | application/pdf | - |
| dc.language | eng | - |
| dc.publisher | Sociedad Mexicana de Fisica | - |
| dc.relation | info:eu-repo/semantics/altIdentifier/url/https://rmf.smf.mx/pdf/rmf-s/53/7/53_7_253.pdf | - |
| dc.rights | info:eu-repo/semantics/openAccess | - |
| dc.rights | https://creativecommons.org/licenses/by-nc-sa/2.5/ar/ | - |
| dc.source | reponame:CONICET Digital (CONICET) | - |
| dc.source | instname:Consejo Nacional de Investigaciones Científicas y Técnicas | - |
| dc.source | instacron:CONICET | - |
| dc.subject | MICROCRYSTALLINE SILICON | - |
| dc.subject | AFM | - |
| dc.subject | STRUCTURAL PROPERTIES | - |
| dc.subject | THIN FILMS | - |
| dc.subject | Otras Ciencias Físicas | - |
| dc.subject | Ciencias Físicas | - |
| dc.subject | CIENCIAS NATURALES Y EXACTAS | - |
| dc.title | Structural and optical properties of compensated microcrystalline silicon films | - |
| dc.type | info:eu-repo/semantics/article | - |
| dc.type | info:eu-repo/semantics/publishedVersion | - |
| dc.type | info:ar-repo/semantics/articulo | - |
| Aparece en las colecciones: | CONICET | |
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